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根據(jù)XXX委托，YYY對XXX生產(chǎn)ZZZ型X輻照加固微處理器制定了單粒子效應(yīng)試驗(yàn)方案。依據(jù)試驗(yàn)方案，采用XXXZZZ電路單粒子效應(yīng)檢測系統(tǒng)，并利用蘭州近代物理研究所回旋加速器的Bi離子和中國原子能科學(xué)研究院HI-13串列靜電加速器的O、Si、Cl、Ge離子，進(jìn)行了ZZZ單粒子效應(yīng)鑒定試驗(yàn)。
As entrusted by XXX, YYY develops the SEE test plan for ZZZ radiation-hardened X microprocessor manufactured by XXX. Based on the test plan, the YYY conducts SEE qualification test to ZZZ by adopting ZZZ circuit SEE detecting system of XXX and using Bi ion of cyclotron of Institute of Modern Physics, CAS and O, Si, Cl, Ge ions of HI-13 tandem electrostatic accelerator of China Institute of Atomic Energy.
本試驗(yàn)采用ZZZ處理器的系統(tǒng)驗(yàn)證板來進(jìn)行單粒子試驗(yàn)，試驗(yàn)板上包括被測單元模塊、PC機(jī)主控單元模塊、程序存儲單元、通信單元等，被測單元包含被測處理器，主要是被測處理器運(yùn)行訓(xùn)練程序平臺進(jìn)行功能測試，包括對整數(shù)單元（IU）、浮點(diǎn)單元（FPU）、高速二級緩存單元（CACHE）和寄存器文件單元（REGFILE）的單粒子測試。
The SEE test is carried out by adopting the system validation board of ZZZ processor. There is test unit module, MCU module of PC, program storage units and communication units, etc. on the test board. Test units include test processor, and the functional tests (including SEE test of integer unit (IU), floating-point unit (FPU), L2 cache unit (CACHE) and registration file unit (REGFILE)) are mainly done by the test processor through operating the training program platform.
根據(jù)XXX檢測系統(tǒng)測得的地面單粒子試驗(yàn)數(shù)據(jù)，得到器件Cache 區(qū)單粒子翻轉(zhuǎn)飽和截面為xE-3cm2/器件，LET閾值為xMeV.cm2/mg（x%飽和截面），如圖3所示。計算出GEO軌道（xkm/0°）器件Cache 區(qū)的單粒子翻轉(zhuǎn)率為xE-1次/器件.天（Adams x%最壞情況，xmm等效Al屏蔽）。
According to the ground SEE test data obtained by the detecting system of XXX, the SEU saturated cross section of device in the Cache zone is xE-3cm2/device and the LET threshold value is xMeV.cm2/mg (x% saturated cross section), as shown in Fig. 3. SEU rate of device in the Cache zone on the GEO orbit (xkm/0°) is calculated to be xE-1 times/device•day (Adamsx% worst case, xmm equivalent Al shielding).

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