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The purpose of this document is to provide guidance to space flight programs and technology developers for radiation testing and qualification of nonvolatile memories (NVMs), with emphasis on modern flash memory devices. This document assumes a basic knowledge of radiation effects and of the space radiation environment on the part of the reader.
本文檔旨在為太空飛行項(xiàng)目和技術(shù)開(kāi)發(fā)人員提供關(guān)于非易失性存儲(chǔ)器（NVM）的輻射測(cè)試和資格認(rèn)證的指導(dǎo)，重點(diǎn)關(guān)注現(xiàn)代閃存存儲(chǔ)器設(shè)備。本文假定讀者具有輻射效應(yīng)和太空輻射環(huán)境的基本知識(shí)。
Decades ago, spacecraft NVM often meant a tape recorder. Solid state devices became more common, due to the increased reliability from not containing any moving part. This is an important advantage over many alternatives. However, solid state devices have other reliability issues, particularly when exposed to the space radiation environment.
幾十年前，航天器NVM通常指的是磁帶記錄器。后來(lái)固態(tài)器件變得更加普遍，因?yàn)槠洳缓魏我苿?dòng)部件而具有更高的可靠性。這是相對(duì)于許多替代方案所呈現(xiàn)出的重要優(yōu)勢(shì)。然而，固態(tài)器件在暴露于太空輻射環(huán)境時(shí)存在其他可靠性問(wèn)題。
Nonvolatile memories onboard spacecraft systems must operate in a radiation environment consisting of electrons and ions that span the entire periodic table. Exposure to those ions may cause significant damage to critical components and compromise the mission’s success. The actual particle fluxes will vary widely, depending on the spacecraft orbit, solar activity and shielding.
太空航天系統(tǒng)上的非易失性存儲(chǔ)器必須在包含整個(gè)周期表的電子和離子的輻射環(huán)境中運(yùn)行。暴露于這些離子可能會(huì)對(duì)關(guān)鍵部件造成重大損壞，并危及任務(wù)的成功。實(shí)際的粒子通量會(huì)因太空航天器軌道、太陽(yáng)活動(dòng)和屏蔽情況而大不相同。
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